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Other articles related with "soft logic upset"：
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68505 |
Yu-Qian Liu(刘彧千), Chang-Chun Chai(柴常春), Yu-Hang Zhang(张宇航), Chun-Lei Shi(史春蕾), Yang Liu(刘阳), Qing-Yang Fan(樊庆扬), Yin-Tang Yang(杨银堂) |
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Physics-based analysis and simulation model of electromagnetic interference induced soft logic upset in CMOS inverter |
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Chin. Phys. B
2018 Vol.27 (6): 68505-068505
[Abstract]
(540)
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[PDF 887 KB]
(166)
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